Important Improvements of Helium Mass Spectrometry Test for Sealability

Genglin Wang; Ningbo Li; Wenbin Li; Fei Li; Weigang Wu; Yongmin Liu

doi:doi:10.11648/j.jeee.20190701.12

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Important Improvements of Helium Mass Spectrometry Test for Sealability

Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, Yongmin Liu

Published in Journal of Electrical and Electronic Engineering (Volume 7, Issue 1)

Received: 11 December 2018 Accepted: 15 January 2019 Published: 13 February 2019

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Abstract

Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.

Published in	Journal of Electrical and Electronic Engineering (Volume 7, Issue 1)
DOI	10.11648/j.jeee.20190701.12
Page(s)	8-22
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2019. Published by Science Publishing Group

Keywords

Sealability of Electronic Components, Helium Mass Spectrometry Test, Fine-Leak Test Basic Criterion, Maximum Detection-Waiting Time, Gross/Fine-Leak Combination Test, Argon as Gross-Leak Test Tracer Gas, Detection Missing Prevention

References

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[23]	Applicant: Beijing Keytone Electronic Relay Corporation, Inventors: Genglin Wang, Fei Li, Caiyi Wang, Ningbo Li, Method for Helium Mass Spectrometric Fine-Leak Test Besed on Quantitative Determination of Maximum Test-Waiting Time, Chinese invention patent No: ZL 201310047094.3, Application date 06/02/13, Authorization Date 28/12/16. United States invention patent No:14/93.658, Filed 06/12/13, Date of Patent 06/06/17.
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APA Style

Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, et al. (2019). Important Improvements of Helium Mass Spectrometry Test for Sealability. Journal of Electrical and Electronic Engineering, 7(1), 8-22. https://doi.org/10.11648/j.jeee.20190701.12

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ACS Style

Genglin Wang; Ningbo Li; Wenbin Li; Fei Li; Weigang Wu, et al. Important Improvements of Helium Mass Spectrometry Test for Sealability. J. Electr. Electron. Eng. 2019, 7(1), 8-22. doi: 10.11648/j.jeee.20190701.12

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AMA Style

Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, et al. Important Improvements of Helium Mass Spectrometry Test for Sealability. J Electr Electron Eng. 2019;7(1):8-22. doi: 10.11648/j.jeee.20190701.12

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@article{10.11648/j.jeee.20190701.12,
  author = {Genglin Wang and Ningbo Li and Wenbin Li and Fei Li and Weigang Wu and Yongmin Liu},
  title = {Important Improvements of Helium Mass Spectrometry Test for Sealability},
  journal = {Journal of Electrical and Electronic Engineering},
  volume = {7},
  number = {1},
  pages = {8-22},
  doi = {10.11648/j.jeee.20190701.12},
  url = {https://doi.org/10.11648/j.jeee.20190701.12},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.jeee.20190701.12},
  abstract = {Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.},
 year = {2019}
}

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TY  - JOUR
T1  - Important Improvements of Helium Mass Spectrometry Test for Sealability
AU  - Genglin Wang
AU  - Ningbo Li
AU  - Wenbin Li
AU  - Fei Li
AU  - Weigang Wu
AU  - Yongmin Liu
Y1  - 2019/02/13
PY  - 2019
N1  - https://doi.org/10.11648/j.jeee.20190701.12
DO  - 10.11648/j.jeee.20190701.12
T2  - Journal of Electrical and Electronic Engineering
JF  - Journal of Electrical and Electronic Engineering
JO  - Journal of Electrical and Electronic Engineering
SP  - 8
EP  - 22
PB  - Science Publishing Group
SN  - 2329-1605
UR  - https://doi.org/10.11648/j.jeee.20190701.12
AB  - Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.
VL  - 7
IS  - 1
ER  -

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Author Information

Genglin Wang

Corporation Headquarter, Beijing Keytone Electronic Relay Corporation, Beijing, China
Ningbo Li

Design Center, Beijing Keytone Electronic Relay Corporation, Beijing, China
Wenbin Li

Corporation Headquarter, Beijing Keytone Electronic Relay Corporation, Beijing, China
Fei Li

Production Center, Beijing Keytone Electronic Relay Corporation, Beijing, China
Weigang Wu

Design Center, Beijing Keytone Electronic Relay Corporation, Beijing, China
Yongmin Liu

Administration Office, Beijing Keytone Electronic Relay Corporation, Beijing, China

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Plain Text BibTeX RIS

APA Style

Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, et al. (2019). Important Improvements of Helium Mass Spectrometry Test for Sealability. Journal of Electrical and Electronic Engineering, 7(1), 8-22. https://doi.org/10.11648/j.jeee.20190701.12

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ACS Style

Genglin Wang; Ningbo Li; Wenbin Li; Fei Li; Weigang Wu, et al. Important Improvements of Helium Mass Spectrometry Test for Sealability. J. Electr. Electron. Eng. 2019, 7(1), 8-22. doi: 10.11648/j.jeee.20190701.12

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AMA Style

Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, et al. Important Improvements of Helium Mass Spectrometry Test for Sealability. J Electr Electron Eng. 2019;7(1):8-22. doi: 10.11648/j.jeee.20190701.12

Copy | Download

@article{10.11648/j.jeee.20190701.12,
  author = {Genglin Wang and Ningbo Li and Wenbin Li and Fei Li and Weigang Wu and Yongmin Liu},
  title = {Important Improvements of Helium Mass Spectrometry Test for Sealability},
  journal = {Journal of Electrical and Electronic Engineering},
  volume = {7},
  number = {1},
  pages = {8-22},
  doi = {10.11648/j.jeee.20190701.12},
  url = {https://doi.org/10.11648/j.jeee.20190701.12},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.jeee.20190701.12},
  abstract = {Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.},
 year = {2019}
}

Copy | Download

TY  - JOUR
T1  - Important Improvements of Helium Mass Spectrometry Test for Sealability
AU  - Genglin Wang
AU  - Ningbo Li
AU  - Wenbin Li
AU  - Fei Li
AU  - Weigang Wu
AU  - Yongmin Liu
Y1  - 2019/02/13
PY  - 2019
N1  - https://doi.org/10.11648/j.jeee.20190701.12
DO  - 10.11648/j.jeee.20190701.12
T2  - Journal of Electrical and Electronic Engineering
JF  - Journal of Electrical and Electronic Engineering
JO  - Journal of Electrical and Electronic Engineering
SP  - 8
EP  - 22
PB  - Science Publishing Group
SN  - 2329-1605
UR  - https://doi.org/10.11648/j.jeee.20190701.12
AB  - Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.
VL  - 7
IS  - 1
ER  -

Copy | Download